立命館大学との共同研究の成果が IEEJ Transactions on Electrical and Electronic Engineering に受理されました。

プラスチック光ファイバの補強層のエッチング長が内部の応力分布に与える影響を解明した論文が、IEEJ Transactions on Electrical and Electronic Engineering に受理されました。立命館大学の中西君（M2）が中心となって進めた共同研究の成果です。

T. Nakanishi, R. Nakashima, K. Ishida, Y. Wada, C. Y. Lo, K. Nakamura, H. Lee, Y. Mizuno, D. Yamane, “Radial stress distribution in micro dry-etched perfluorinated polymer optical fibers,” IEEJ Trans. Electr. Electron. Eng., accepted.

This paper presents the first investigation into how the dry etching depth of the reinforcement layer in perfluorinated polymer optical fibers (PF-POFs) influences radial stress distribution. Using finite element method simulations, we model the PF-POF structure based on the actual dry-etched profiles achieved through reactive ion etching (RIE). The results demonstrate that increasing the etching depth leads to higher radial stress in both the core and cladding layers when strain is applied longitudinally. These findings suggest that RIE processes present a feasible method for tuning the sensitivity of PF-POF-based strain sensors.